DocumentCode
2045032
Title
A new assessment of the use of wide bandgap semiconductors and the potential for GaN
Author
Hudgins, J.L. ; Simin, G.S. ; Khan, M.A.
Author_Institution
Dept. of Electr. Eng., South Carolina Univ., Columbia, SC, USA
Volume
4
fYear
2002
fDate
2002
Firstpage
1747
Lastpage
1752
Abstract
An advantage for some wide bandgap materials, that is often overlooked, is that the thermal coefficient of expansion (CTE) is better matched to the ceramics in use for packaging technology. It is shown that the optimal choice for uni-polar devices is clearly GaN. It is further shown that the future optimal choice for bipolar devices is C (diamond). A new expression relating the critical electric field for breakdown in abrupt junctions to the material bandgap energy is derived and is further used to derive new expressions for specific on-resistance in power semiconductor devices. These new expressions are compared to the previous literature and the efficacy of specific power devices, such as heterojunction MOSFETs, using GaN are discussed
Keywords
III-V semiconductors; gallium compounds; p-n heterojunctions; power MOSFET; semiconductor device breakdown; semiconductor device packaging; thermal expansion; wide band gap semiconductors; C; GaN; abrupt junctions; bipolar devices; breakdown; ceramics; critical electric field; diamond; heterojunction MOSFETs; material bandgap energy; on-resistance; packaging technology; power semiconductor devices; thermal coefficient of expansion; uni-polar devices; wide bandgap semiconductors; Ceramics; Electric breakdown; Gallium nitride; Photonic band gap; Power semiconductor devices; Semiconductor device breakdown; Semiconductor device packaging; Semiconductor materials; Thermal expansion; Wide band gap semiconductors;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 2002. pesc 02. 2002 IEEE 33rd Annual
Conference_Location
Cairns, Qld.
Print_ISBN
0-7803-7262-X
Type
conf
DOI
10.1109/PSEC.2002.1023063
Filename
1023063
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