• DocumentCode
    2045520
  • Title

    Dielectric windows improve sensitivity of partial discharge detection at UHF

  • Author

    Judd, M.D.

  • Author_Institution
    Centre for Electr. Power Eng., Strathclyde Univ., Glasgow, UK
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    304
  • Lastpage
    307
  • Abstract
    To detect partial discharges (PD) in equipment such as gas insulated substations and power transformers, UHF couplers can often be fitted at dielectric apertures (windows) in the metal cladding. Waveguide theory is used to show how the window structure affects PD detection sensitivity in the UHF band. By increasing the relative permittivity of the propagation medium, the effective diameter of the window can be increased, leading to improved UHF signal transfer. A given sensitivity to PD can therefore be achieved using a smaller, more robust window, which is particularly important when the insulation is a liquid or gas under pressure. Alternatively, if the window size is fixed, filling it entirely with a dielectric material can improve PD detection sensitivity. A window designed specifically for coupling UHF signals is proposed as an alternative to the use of internal couplers
  • Keywords
    UHF couplers; UHF measurement; gas insulated substations; gas insulated transformers; insulation testing; partial discharge measurement; power transformer insulation; waveguide theory; UHF couplers; detection sensitivity; dielectric apertures; dielectric windows; effective window diameter; gas insulated substations; improved UHF signal transfer; metal cladding; partial discharge detection; power transformers; relative permittivity; robust window; waveguide theory; window structure effect; Apertures; Couplers; Dielectrics and electrical insulation; Gas insulation; Partial discharges; Permittivity; Power transformer insulation; Power transformers; Substations; Waveguide theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-5931-3
  • Type

    conf

  • DOI
    10.1109/ELINSL.2000.845513
  • Filename
    845513