Title :
In-situ Lorentz microscopy of magnetic nanostructures
Author :
McVitie, S. ; Lim, C.K. ; Yi, G. ; Nicholson, W.A.P. ; Chapman, J.N.
Author_Institution :
Dept. of Phys. & Astron., Glasgow Univ., UK
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we describe results from a newly developed stage which comprises two wires situated close to the sample which give a field parallel to the thin film plane and which in principle should give no net deflection of the electron beam. This stage can be used for steady or pulsed fields and is specifically designed for use with TEM silicon nitride membrane substrates.
Keywords :
ferromagnetic materials; iron alloys; magnetic domain walls; magnetic structure; magnetic thin films; nanostructured materials; nickel alloys; transmission electron microscopy; Lorentz microscopy; NiFe; SiN; TEM silicon nitride membrane substrates; magnetic domain walls; magnetic nanostructures; thin film; wires; Coils; Lenses; Magnetic films; Magnetic force microscopy; Magnetic switching; Magnetization; Nanostructures; Physics; Transistors; Transmission electron microscopy;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230434
