DocumentCode
2045920
Title
In-situ Lorentz microscopy of magnetic nanostructures
Author
McVitie, S. ; Lim, C.K. ; Yi, G. ; Nicholson, W.A.P. ; Chapman, J.N.
Author_Institution
Dept. of Phys. & Astron., Glasgow Univ., UK
fYear
2003
fDate
March 30 2003-April 3 2003
Abstract
In this paper, we describe results from a newly developed stage which comprises two wires situated close to the sample which give a field parallel to the thin film plane and which in principle should give no net deflection of the electron beam. This stage can be used for steady or pulsed fields and is specifically designed for use with TEM silicon nitride membrane substrates.
Keywords
ferromagnetic materials; iron alloys; magnetic domain walls; magnetic structure; magnetic thin films; nanostructured materials; nickel alloys; transmission electron microscopy; Lorentz microscopy; NiFe; SiN; TEM silicon nitride membrane substrates; magnetic domain walls; magnetic nanostructures; thin film; wires; Coils; Lenses; Magnetic films; Magnetic force microscopy; Magnetic switching; Magnetization; Nanostructures; Physics; Transistors; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7647-1
Type
conf
DOI
10.1109/INTMAG.2003.1230434
Filename
1230434
Link To Document