• DocumentCode
    2045921
  • Title

    On-site diagnosis of power and special transformers

  • Author

    Kachler, A.J.

  • Author_Institution
    Div. of Power & Distribution Transformer, Siemens AG, Nuremberg, Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    362
  • Lastpage
    367
  • Abstract
    This paper deals-after a brief introduction to transformer life-management-with the difficult subject of condition assessment of transformers and the required or available diagnostic procedures. The On-site Diagnosis is achievable with a multitude of procedures if consequential approaches are taken. Equally important are the Fingerprints to characterize the initial status, the Periodic Check and or the On-Line Monitoring information. To date-except for a few special cases-on-site-diagnosis can verify: 1) dielectric failures in magnet circuits; 2) dielectric failures in windings and main insulation; 3) dielectric failures in bushings and tap changers; 4) failures due to dynamic impact; 5) failures due to critical thermal or dielectric aging. The particular diagnostic procedures for the individual perspectives are presented and discussed. The On-Line-Monitoring can as a sort of “early warning systems” offer great assistance and save tremendous costs. Therefore also the most promising On-Line-Monitoring procedures are discussed
  • Keywords
    insulation testing; power transformer insulation; power transformer testing; condition assessment; dielectric failure; early warning system; failure; fingerprint; life management; on-line monitoring; on-site diagnosis; periodic check; power transformer; special transformer; Aging; Dielectrics and electrical insulation; Electric variables measurement; Failure analysis; Fingerprint recognition; Mechanical variables measurement; Moisture measurement; Q measurement; Thermal stresses; Transformers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-5931-3
  • Type

    conf

  • DOI
    10.1109/ELINSL.2000.845526
  • Filename
    845526