DocumentCode
2046006
Title
The application of three-dimensional atom probe analysis to GMR materials
Author
Petford-Long, A.K. ; Larson, D.J. ; Cerezo, A.
Author_Institution
Dept. of Mater., Oxford Univ., UK
fYear
2003
fDate
March 30 2003-April 3 2003
Abstract
We discuss the giant magnetoresistance (GMR) property of CoFe/Cu magnetic multilayers. TEM images of the Co/Pt multilayer film show the crystal structure in the layers.
Keywords
cobalt; cobalt alloys; copper; crystal structure; ferromagnetic materials; giant magnetoresistance; magnetic multilayers; magnetic thin films; platinum; transmission electron microscopy; Co-Pt; Co/Pt multilayer film; CoFe-Cu; CoFe/Cu magnetic multilayer; GMR materials; TEM; crystal structure; giant magnetoresistance; three-dimensional atom probe analysis; Atomic layer deposition; Atomic measurements; Drives; Giant magnetoresistance; Magnetic materials; Microscopy; Needles; Nonhomogeneous media; Probes; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7647-1
Type
conf
DOI
10.1109/INTMAG.2003.1230437
Filename
1230437
Link To Document