Title :
Using the EM simulation tools to predict EMC immunity behavior of a automotive electronic board after a component change
Author :
Durier, Andre ; Marot, Christian ; Alilou, Oussama
Author_Institution :
Quality Labs. EMC Design Support, Continental Automotive France SAS, Toulouse, France
Abstract :
Integrated Circuit obsolescence is a strong economic constraint for electronic suppliers. It becomes essential to develop a methodology aiming to guarantee the non regression of EMC performances of equipments during an immunity test. The use of numerical simulation tools seems to be a way to reach this target. But these tools need first EMC behavioral component´s models built from the most appropriate EMC measurements.
Keywords :
automotive electronics; electromagnetic compatibility; integrated circuits; numerical analysis; EM simulation tool; EMC immunity behavior; automotive electronic board; electronic supplier; integrated circuit; numerical simulation tool; Current measurement; Immunity testing; Integrated circuit modeling; Probes; Regulators; Wires; BCI; DPI; IC immunity; immunity modeling;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location :
Brugge
