DocumentCode :
2046236
Title :
3D Atomic Characterization by Using Field Ion Computed Tomography
Author :
Vurpillot, F. ; Danoix, F. ; Lefebvre, W. ; Radiguet, B. ; Deconihout, B.
Author_Institution :
CNRS, Rouen Univ., Saint-Etienne
fYear :
2006
fDate :
38899
Firstpage :
529
Lastpage :
529
Abstract :
Summary form only given. Three dimensional field ion microscopy (FIM) images have been reconstructed using successive images of a FIM movie. This capability opens a new dimension to the observation with the FIM of various crystallographic features. The resolution of the instrument is proven to be better than 0.05 nm in depth and 0.3 nm laterally in favourable cases. This enables small objects to be observed 3D. For instance, for the first time, "Guinier-Preston" zones were imaged in 3D in steel. Using this technique, the volume fraction of precipitates in an AlZrSc alloy was directly measured in large volume compared to 3DAP dataset. The shell like structure of these precipitates was also clearly imaged. Others examples will be presented
Keywords :
aluminium alloys; atom probe field ion microscopy; image reconstruction; precipitation; scandium alloys; zirconium alloys; AlZrSc; AlZrSc alloy; field ion computed tomography; precipitates; shell like structure; three dimensional field ion microscopy; volume fraction; Atomic measurements; Computed tomography; Crystallography; Image reconstruction; Instruments; Microscopy; Motion pictures; Steel; Volume measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
Type :
conf
DOI :
10.1109/IVNC.2006.335329
Filename :
4134693
Link To Document :
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