DocumentCode
2046337
Title
A self-adjusting scheme to determine the optimum RBB by monitoring leakage currents
Author
Jayakumar, Nikhil ; Sandeep Dhar ; Khatri, Sunil P.
Author_Institution
Dept. of EE, Texas A&M Univ., College Station, TX, USA
fYear
2005
fDate
13-17 June 2005
Firstpage
43
Lastpage
46
Abstract
Reverse body biasing (RBB) is often used to reduce the leakage power of a device. However, recent research has shown that if this applied RBB is too high, the leakage power can actually increase due to the contribution of band-to-band tunneling (BTBT) currents. Hence, there exists an optimal RBB value at which the leakage is minimum. This optimum point can vary with temperature and process variations. In this paper we show that it is desirable to operate at the optimal RBB point which minimizes total leakage. We present a scheme that monitors the total leakage current (the sum of the sub-threshold, BTBT and gate leakage) of an IC with a representative leaking device and, using this monitored value, automatically finds the optimum RBB value across temperature and process corners, using a self-adjusting circuit. Our approach has a modest placed-and-routed area utilization, and a low power consumption.
Keywords
MOS integrated circuits; circuit optimisation; circuit simulation; integrated circuit design; leakage currents; low-power electronics; BTBT currents; RBB; band-to-band tunneling currents; gate leakage; leakage currents; leakage power; power consumption; reverse body biasing; self-adjusting circuit; self-adjusting scheme; Computerized monitoring; DH-HEMTs; Energy consumption; Gate leakage; Leakage current; MOS devices; Permission; Temperature; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN
1-59593-058-2
Type
conf
DOI
10.1109/DAC.2005.193770
Filename
1510289
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