Title :
Microstructure and segregation effect of Co/Pd multilayer perpendicular magnetic recording media
Author :
Matsunuma, S. ; Yano, A. ; Koda, T. ; Onuma, T. ; Fujita, E.
Author_Institution :
Dev. & Technol. Div., Hitachi Maxell Ltd., Yawara, Japan
fDate :
March 30 2003-April 3 2003
Abstract :
In this report, we have investigated addition of boron with modulated contents in depth profile and microstructure by a transmission electron microscopy (TEM) with high annular angle dark field (HAADF) detector to evaluate segregation effect.
Keywords :
boron; cobalt; crystal microstructure; ferromagnetic materials; magnetic multilayers; palladium; perpendicular magnetic recording; segregation; transmission electron microscopy; Co-Pd; Co-Pd-B; Co/Pd multilayer; TEM; boron addition; depth profile; high annular angle dark field; microstructure; perpendicular magnetic recording media; segregation; transmission electron microscopy; Anisotropic magnetoresistance; Boron; Electrons; Magnetic hysteresis; Magnetic multilayers; Magnetic properties; Microstructure; Nonhomogeneous media; Perpendicular magnetic recording; Thermal stability;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230451
