Title :
Microelectronics packaging processing using focused high power electron beams
Author :
Yau, You-Wen ; Booke, Michael A. ; Sandhu, Nirmal S. ; Fulton, Joseph J.
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Abstract :
It has been demonstrated that focused high-power electron beams are alternatives for patterning next-generation multilayer ceramic packaging. The advantages of using high-power electron beams include high resolution, flexibility, and direct write capability. Higher-density packages can be fabricated using this process tool technology. Electron beams are software-driven. Quick turnaround time can be accomplished for customized packaging circuit designs. Electron beams can efficiently transfer energy to thermally remove ceramic green-sheet materials. Electron-beam machining of ceramic green sheets has been investigated. Experimental results indicate small-size and/or high density via holes can be generated. It is demonstrated that line patterns can be delineated
Keywords :
ceramics; electron beam lithography; packaging; ceramic green-sheet materials; customized packaging; direct write capability; flexibility; focused high power electron beams; line patterns; next-generation multilayer ceramic packaging; process tool technology; resolution; turnaround time; via holes; Ceramics; Electron beams; Fabrication; Machining; Microelectronics; Nonhomogeneous media; Packaging machines; Punching; Semiconductor device packaging; Sheet materials;
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
DOI :
10.1109/ECTC.1991.163946