Title :
Influence of Emitter Temperature and Ionization Potentials of Emitter Atoms on Charge of Evaporated Ions
Author :
Golubev, Oleg L. ; Loginov, Michail V.
Author_Institution :
A.F. Ioffe Phys. Tech. Inst., Russian Acad. of Sci., St. Petersburg
Abstract :
The influence of emitter temperature and ionisation potentials of emitter atoms on the process of field evaporation was studied by means of time-of flight atom probe and field emission microscopy. For the study of the influence of ionization potential on the evaporation process alloy NiCr (20% Cr, 80% Ni) and carbide W were selected. The mass spectrum were obtained at various emitter temperature T from 80 K to the temperature near the melting point. Evaporation of easy evaporated element leads to reduction of binding energy of more difficult evaporated element before such values, as its evaporation becomes to be possible at the same value Fev
Keywords :
binding energy; chromium alloys; field emission electron microscopy; field emitter arrays; field evaporation; ionisation; melting point; nickel alloys; time of flight mass spectra; NiCr; binding energy; emitter atoms; emitter temperature; evaporated ions; field emission microscopy; field evaporation; ionization potentials; mass spectrum; melting point; reduction; time-of flight atom probe; Aerospace materials; Atomic layer deposition; Chromium alloys; Heating; Ionization; Iron; Microscopy; Nickel alloys; Probes; Temperature;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
DOI :
10.1109/IVNC.2006.335359
