Proceedings of 1995 IEEE International Test Conference (ITC)

The following topics were dealt with: RAM BIST and intelligent testing; mixed-signal device testing; quality, I_DDQ, and the DUT interface; delay testing; microprocessor testing; MCM test methods; test SPC and support systems; test generation and fault simulation; high-level test synthesis and DFT; contract manufacturing test challenges; test quality, stuck-at faults, and PPM rejects; design for testability; test cost analysis applications; high-speed ATE architectures and timing; defect detection and diagnosis; performance-driven BIST insertion; IC defect detection; boundary scan; functional level test; IC testing and diagnosis; synthesis for testability; software testing; unconventional test development; BIST pattern generation and compaction; design and simulation; ATE and board test systems; IC current-test techniques; deep-submicron test; unpowered opens testing.