DocumentCode
2046652
Title
Analysis of the sensitivity for the TEM cross-correlation method to qualify TEM-waveguides for UWB measurements
Author
Koelling, Christian ; Garbe, Heyno ; Potthast, Stefan
Author_Institution
Inst. of Electr. Eng. & Meas. Technol. (GEM), Leibniz Univ. Hannover, Hannover, Germany
fYear
2013
fDate
2-6 Sept. 2013
Firstpage
185
Lastpage
190
Abstract
This paper deals with the TEM cross-correlation method (TCCM) to qualify and characterize transverse electromagnetic (TEM) waveguides for arbitrary transient signals. In previous papers the applicability of the TCCM to waveguides was shown. The aim of this investigation is to apply the established limits of the various standards (e.g. the IEC 61000-4-20 Annex C) to this new method and determine the sensitivity of the TCCM.
Keywords
ultra wideband technology; waveguides; TCCM; TEM cross-correlation method; TEM-waveguides; UWB measurements; arbitrary transient signals; sensitivity analysis; transverse electromagnetic waveguides; Correlation; Electromagnetic compatibility; Electromagnetic waveguides; IEC standards; TEM cells; Transient analysis; Cross-correlation; GTEM-cell; IEC 61000–4–20; TCCM; TEM waveguide; sensitivity; transient measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location
Brugge
ISSN
2325-0356
Type
conf
Filename
6653225
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