Title :
Analysis of the sensitivity for the TEM cross-correlation method to qualify TEM-waveguides for UWB measurements
Author :
Koelling, Christian ; Garbe, Heyno ; Potthast, Stefan
Author_Institution :
Inst. of Electr. Eng. & Meas. Technol. (GEM), Leibniz Univ. Hannover, Hannover, Germany
Abstract :
This paper deals with the TEM cross-correlation method (TCCM) to qualify and characterize transverse electromagnetic (TEM) waveguides for arbitrary transient signals. In previous papers the applicability of the TCCM to waveguides was shown. The aim of this investigation is to apply the established limits of the various standards (e.g. the IEC 61000-4-20 Annex C) to this new method and determine the sensitivity of the TCCM.
Keywords :
ultra wideband technology; waveguides; TCCM; TEM cross-correlation method; TEM-waveguides; UWB measurements; arbitrary transient signals; sensitivity analysis; transverse electromagnetic waveguides; Correlation; Electromagnetic compatibility; Electromagnetic waveguides; IEC standards; TEM cells; Transient analysis; Cross-correlation; GTEM-cell; IEC 61000–4–20; TCCM; TEM waveguide; sensitivity; transient measurement;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location :
Brugge
