DocumentCode
2046724
Title
The use of linear models for the efficient and accurate testing of A/D converters
Author
Capofreddi, Peter D. ; Wooley, Bruce A.
Author_Institution
Integrated Circuits Lab., Stanford Univ., CA, USA
fYear
1995
fDate
21-25 Oct 1995
Firstpage
54
Lastpage
60
Abstract
Three new methods are presented for using linear models to generate confidence intervals for ADC nonlinearity. The methods are based on the servo loop method the tally and weight method and the code density method
Keywords
analogue-digital conversion; automatic testing; circuit testing; error analysis; nonlinear network analysis; servomechanisms; A/D converters; ADC nonlinearity; accurate testing; code density method; confidence intervals; linear models; servo loop method; tally and weight method; Analog-digital conversion; Circuit testing; Electrical resistance measurement; Integrated circuit modeling; Integrated circuit testing; Laboratories; Servomechanisms; Signal resolution; Time measurement; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529817
Filename
529817
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