Title :
The use of linear models for the efficient and accurate testing of A/D converters
Author :
Capofreddi, Peter D. ; Wooley, Bruce A.
Author_Institution :
Integrated Circuits Lab., Stanford Univ., CA, USA
Abstract :
Three new methods are presented for using linear models to generate confidence intervals for ADC nonlinearity. The methods are based on the servo loop method the tally and weight method and the code density method
Keywords :
analogue-digital conversion; automatic testing; circuit testing; error analysis; nonlinear network analysis; servomechanisms; A/D converters; ADC nonlinearity; accurate testing; code density method; confidence intervals; linear models; servo loop method; tally and weight method; Analog-digital conversion; Circuit testing; Electrical resistance measurement; Integrated circuit modeling; Integrated circuit testing; Laboratories; Servomechanisms; Signal resolution; Time measurement; Vectors;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529817
