Title :
Testing and characterizing jitter in 100BASE-TX and 155.52 Mbit/s ATM devices with a 1 Gsamples/s AWG in an ATE system
Author_Institution :
Commun. Device Test, Credence Syst. Corp., Beaverton, OR, USA
Abstract :
An ATE system uses a phase-synchronous 1 Gs/s AWG to input waveforms, representing high-speed data communications signals degraded by twisted-pair cable, into a 100BASE-TX and 155.52 Mbit/s ATM transceiver. A phase-synchronous Digital Capture Port captures the resulting received data outputs. The captured waveforms are statistically analyzed to measure various modes of jitter
Keywords :
asynchronous transfer mode; automatic test equipment; integrated circuit testing; jitter; local area networks; statistical analysis; twisted pair cables; waveform generators; 100BASE-TX; 155.52 Mbit/s; ATE system; ATM devices; IC testing; LAN; arbitrary waveform generator; digital capture port; high-speed data communications signals; jitter; phase-synchronous AWG; received data outputs; statistical analysis; twisted-pair cable; Adaptive equalizers; Cables; Circuit testing; Degradation; Ethernet networks; Jitter; Signal design; Signal restoration; Transceivers; Wiring;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557019
