• DocumentCode
    2046793
  • Title

    On measuring memory length of the error rate process in wireless channels

  • Author

    Ilyas, Muhammad U. ; Radha, Hayder

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI
  • fYear
    2008
  • fDate
    19-21 March 2008
  • Firstpage
    1262
  • Lastpage
    1267
  • Abstract
    Bit errors are orders of magnitude more frequent in wireless channels than in wired channels. Design of network protocols and other architectural components of wireless networking systems entail a better understanding of the process that introduces errors into transmissions. A key characteristic of the error process operating on a channel is its memory length which determines the degree of similarity and clustering of errors. In this paper we demonstrate the inadequacy of correlation coefficient based analysis used in determining memory length of bit level errors to the packet-level bit error rate (BER) process. To overcome this problem we propose an alternate means of measuring channel memory, called the relative mutual information (RMI) and a lower complexity variant, the pairwise RMI. We demonstrate the use of RMI and pairwise RMI to sets of residual bit-error traces collected in IEEE 802.15.4 low rate-wireless personal area network (LR-WPAN) and IEEE 802.11b wireless local area network (WLAN) channels.
  • Keywords
    error statistics; protocols; wireless channels; IEEE 802.11b wireless local area network channels; IEEE 802.15.4; correlation coefficient based analysis; error rate process; low rate-wireless personal area network; memory length; network protocols design; packet-level bit error rate process; relative mutual information; wireless channels; wireless networking systems; Bit error rate; Error analysis; Fading; Interference; Length measurement; Mutual information; Personal area networks; Position measurement; Wireless LAN; Wireless application protocol; Channel memory; Correlation coefficient; IEEE 802.11; IEEE 802.15.4; Memory length; Relative mutual information; Residual bit-error traces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Sciences and Systems, 2008. CISS 2008. 42nd Annual Conference on
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    978-1-4244-2246-3
  • Electronic_ISBN
    978-1-4244-2247-0
  • Type

    conf

  • DOI
    10.1109/CISS.2008.4558712
  • Filename
    4558712