DocumentCode :
2046793
Title :
On measuring memory length of the error rate process in wireless channels
Author :
Ilyas, Muhammad U. ; Radha, Hayder
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI
fYear :
2008
fDate :
19-21 March 2008
Firstpage :
1262
Lastpage :
1267
Abstract :
Bit errors are orders of magnitude more frequent in wireless channels than in wired channels. Design of network protocols and other architectural components of wireless networking systems entail a better understanding of the process that introduces errors into transmissions. A key characteristic of the error process operating on a channel is its memory length which determines the degree of similarity and clustering of errors. In this paper we demonstrate the inadequacy of correlation coefficient based analysis used in determining memory length of bit level errors to the packet-level bit error rate (BER) process. To overcome this problem we propose an alternate means of measuring channel memory, called the relative mutual information (RMI) and a lower complexity variant, the pairwise RMI. We demonstrate the use of RMI and pairwise RMI to sets of residual bit-error traces collected in IEEE 802.15.4 low rate-wireless personal area network (LR-WPAN) and IEEE 802.11b wireless local area network (WLAN) channels.
Keywords :
error statistics; protocols; wireless channels; IEEE 802.11b wireless local area network channels; IEEE 802.15.4; correlation coefficient based analysis; error rate process; low rate-wireless personal area network; memory length; network protocols design; packet-level bit error rate process; relative mutual information; wireless channels; wireless networking systems; Bit error rate; Error analysis; Fading; Interference; Length measurement; Mutual information; Personal area networks; Position measurement; Wireless LAN; Wireless application protocol; Channel memory; Correlation coefficient; IEEE 802.11; IEEE 802.15.4; Memory length; Relative mutual information; Residual bit-error traces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Sciences and Systems, 2008. CISS 2008. 42nd Annual Conference on
Conference_Location :
Princeton, NJ
Print_ISBN :
978-1-4244-2246-3
Electronic_ISBN :
978-1-4244-2247-0
Type :
conf
DOI :
10.1109/CISS.2008.4558712
Filename :
4558712
Link To Document :
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