Title :
Spatially distributed 3D circuit models
Author :
Beattie, Michael ; Zheng, Hui ; Devgan, Anirudh ; Krauter, Byron
Author_Institution :
Electron. Design Autom., IBM Corp., Austin, TX, USA
Abstract :
Spatially distributed 3D circuit models are extracted with a segment-to-segment BEM (boundary element method) algorithm for both capacitance and inverse inductance couplings rather than using the traditional net-to-net approach. Critical issues regarding the extraction efficiency and accuracy of segment-to-segment BEM capacitance models are explored. An adaptive discretization scheme is developed for segment-to-segment capacitance extraction and also applied to segment-to-segment high-frequency inverse inductance extraction. We demonstrate the limitations of the duality between capacitance and inverse inductance. Examples demonstrating the accuracy of these models are presented for real packaging cases.
Keywords :
ball grid arrays; boundary-elements methods; circuit analysis computing; integrated circuit modelling; integrated circuit packaging; adaptive discretization; ball grid arrays; boundary element method algorithm; capacitance coupling; extraction efficiency; integrated circuit modelling; integrated circuit packaging; inverse inductance coupling; segment-to-segment BEM algorithm; segment-to-segment BEM capacitance models; segment-to-segment capacitance extraction; segment-to-segment high-frequency inverse inductance extraction; spatially distributed 3D circuit models; Capacitance; Coupling circuits; Data mining; Design automation; Electrostatics; Inductance; Inverse problems; Magnetostatics; Shape; Sparse matrices;
Conference_Titel :
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN :
1-59593-058-2
DOI :
10.1109/DAC.2005.193790