DocumentCode
2046966
Title
Lifetime predictions due to electromigration failure in tape heads
Author
Johnson, R.A. ; Yiqian Wu ; Clark, W.D. ; Woo-Young Yoon
Author_Institution
Quantum Corp., Strewsbury, MA, USA
fYear
2003
fDate
March 30 2003-April 3 2003
Abstract
In this paper, we have analyzed accelerated testing on thin film AMR tape recording heads in order to estimate their mean-time-to-finite under operating conditions were far from the operating conditions. The datas were analyzed in different techniques. The results generally predicted a mean time to failure on the order of 10/sup 7/. However, it is clear electromigration not be measurable contributor to heads failure in this product.
Keywords
automatic meter reading; electromigration; failure analysis; magnetic heads; magnetic recording; magnetic tapes; magnetic thin films; electromigration failure; lifetime predictions; magnetic tape heads; mean time-failure analysis; thin film AMR tape recording heads; Current density; Electromigration; Equations; Failure analysis; Input variables; Large Hadron Collider; Life estimation; Magnetic heads; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7647-1
Type
conf
DOI
10.1109/INTMAG.2003.1230477
Filename
1230477
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