Title :
Applying amorphous CoNbZr shield to improve the dielectric-breakdown voltages of the gap layers of narrow-gap read heads
Author :
Hoshino, K. ; Odai, S. ; Hatatani, M.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Kanagawa, Japan
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, the effect of the lower shield materials on the breakdown voltage of the lower insulating gap layer has been investigated. A hybrid shield CoNbZr layer on NiFe shield was applied ton the read , and the resulting narrow gap head´s performance in reading was observed.
Keywords :
amorphous magnetic materials; cobalt alloys; electric breakdown; ferromagnetic materials; insulating thin films; iron alloys; magnetic heads; magnetic shielding; nickel alloys; niobium alloys; zirconium alloys; CoNbZr; NiFe; NiFe shield; amorphous CoNbZr shield; dielectric-breakdown voltages; insulating gap layer; narrow-gap read heads; Amorphous materials; Dielectric measurements; Dielectric substrates; Dielectrics and electrical insulation; Disk recording; Electrodes; Hard disks; Magnetic heads; Testing; Voltage;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230478
