Title :
Advanced flip chip encapsulation: transfer molding process for simultaneous underfilling and postencapsulation
Author :
Becker, Karl-F ; Braun, T. ; Koch, M. ; Ansorge, F. ; Aschenbrenner, R. ; Reichl, H.
Author_Institution :
Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
Abstract :
The process development for four flip chip molding compounds was based on material characterization by DSC, DMA and TMA. It was shown that the materials tested do allow reliable flip chip molding. Materials properties concerning processability and reliability are promising. There is strong potential of the technology for the increasing market of flip chip packages as certain types of BGA´s and, with further miniaturization, CSP´s. As these packages incorporate typically single dies, the transfer mold process can be adapted without major changes to existing equipment. Even for future developments such as one chip flip chip SIP´s using advanced IC thinning and assembly methods, the flip chip molding underfill process is a successful vision for reliable encapsulation.
Keywords :
Young´s modulus; ball grid arrays; chip scale packaging; circuit reliability; differential scanning calorimetry; encapsulation; flip-chip devices; glass transition; moulding; BGA; CSP; DMA; DSC; IC thinning; TMA; flip chip encapsulation; flip chip molding compounds; material characterization; postencapsulation; processability; reliability; single dies; transfer molding process; underfilling; Costs; Electronic packaging thermal management; Electronics packaging; Encapsulation; Flip chip; Impedance; Semiconductor device packaging; Surfaces; Throughput; Transfer molding;
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, 2001. First International IEEE Conference on
Conference_Location :
Potsdam, Germany
Print_ISBN :
0-7803-7220-4
DOI :
10.1109/POLYTR.2001.973270