Title :
Comparison of field-to-line coupling models: Coupled transmission lines model versus single-cell corrected Taylor model
Author :
Land, Sjoerd Op´t ; Mandic, Tvrtko ; Ramdani, Mohammed ; Baric, Adrijan ; Perdriau, Richard ; Nauwelaers, B.
Author_Institution :
Dept. of Electron., Ecole Super. d´Electron. de Ouest, Angers, France
Abstract :
Models for field-to-line coupling are interesting because they help to predict the immunity of PCBs and explain the relation between routing and immunity. In this article a meandered PCB trace illuminated by EM field in a TEM cell is analysed. The near-end and far-end coupling is predicted using two models: a detailed and an approximative one. The detailed model is a circuit of coupled multi-conductor transmission lines evaluated with a circuit simulator. The approximative model consists of a single Taylor cell with an analytical modification evaluated using a numerical computing tool. Both predictions are compared with measurements and turn out to be equally precise. The advantage of the coupled lines model is its flexibility, the advantage of the modified Taylor model is its ease of use.
Keywords :
TEM cells; electromagnetic compatibility; electromagnetic coupling; electromagnetic fields; immunity testing; multiconductor transmission lines; printed circuits; EM field; PCB immunity; PCB trace; TEM cell; Taylor cell; approximative model; circuit simulator; coupled lines model; coupled multiconductor transmission lines; far-end coupling; field-to-line coupling; near-end coupling; numerical computing tool; Capacitance; Couplings; Electromagnetic compatibility; Integrated circuit modeling; Resonant frequency; TEM cells; Transmission line measurements; EMC; GTEM cell; PCB; TEM cell; field-to-line coupling; immunity; microstrip;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location :
Brugge