DocumentCode :
2047085
Title :
Composite solders
Author :
Marshall, James L. ; Calderon, J. ; Miiller, D. ; DeSimone, M. ; Sees, J. ; Lucey, George ; Hwang, Jennie
Author_Institution :
Centre for Mater. Characterization, North Texas Univ., Denton, TX, USA
fYear :
1991
fDate :
11-16 May 1991
Firstpage :
647
Lastpage :
652
Abstract :
Development of composite solders has been performed utilizing an intermetallic compound interspersed in a solder matrix. The principal work has been done on Cu6Sn5 intermetallic in 60/40 Sn/Pb. The composite solder was prepared by mixing powdered intermetallic in solder paste, with subsequent reflow. Formulations of 10-40% intermetallic (by weight) were investigated. Optical inspection of cross sections demonstrates that the differentiation of the three phases (Sn, Pb, Cu6Sn5) is not easy, owing to the similar appearance of Sn and Cu6Sn5; however, etching with ammonium fluoride/hydrogen peroxide preferentially removes the tin and darkens the lead, making characterization facile. Alternatively, scanning electron micrographs/energy dispersive X-ray (SEM/EDX) analysis of cross sections, using the backscattered detection mode, is an excellent tool for microcharacterization. The mechanical properties of composite solder were examined and were found to be superior to those of standard tin/lead solder. Solder joints were readily prepared utilizing the composite solder and were forced to failure by thermocyclic fatigue; the mechanism of failure was the same as for 60/40 Sn/Pb solder, i.e., heterogeneous coarsening
Keywords :
X-ray chemical analysis; fatigue; lead alloys; scanning electron microscope examination of materials; soldering; tin alloys; SEM/EDX analysis; Sn-Pb; SnPb-Cu6Sn5; backscattered detection mode; characterization; composite solders; etching; heterogeneous coarsening; intermetallic compound; mechanical properties; optical inspection; solder matrix; solder paste; thermocyclic fatigue; Dispersion; Electrons; Etching; Inspection; Intermetallic; Lead; Optical mixing; Tin; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
Type :
conf
DOI :
10.1109/ECTC.1991.163948
Filename :
163948
Link To Document :
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