DocumentCode :
2047087
Title :
Studies on parameters for popcorn cracking
Author :
Dudek, Rainer ; Walter, Hans ; Michel, Bernd ; Alpern, Peter ; Schmidt, Roland ; Tilgner, Rainer
Author_Institution :
Fraunhofer Inst. Reliability & Microintegration, Berlin, Germany
fYear :
2001
fDate :
21-24 Oct. 2001
Firstpage :
140
Lastpage :
148
Abstract :
Theoretical analysis of the popcorn phenomenon requires the thermo-mechanical and moisture diffusion properties of the polymers in the packages under investigation. Some of these properties, including fracture toughness, are given for the four commercially available epoxy molding compounds (EMCs) used. Fracture toughness measurements with precracked beams as well as analyses based on a simple method to estimate the toughness from bending experiments are used. For the latter investigations, the basic assumption is that the filler particles act as initial flaws. The problem is analytically treated as a beam with a surface crack, and an estimate of the critical fracture toughness can be calculated by a simple formula. By means of 3D-FE analyses the moisture diffusion into a thin quad flat pack (TQFP) package is studied for various standard moisture preconditioning levels. It is shown that the different popcorn failure types correspond to different moisture distributions within the die attach layer depending on the different preconditioning levels.
Keywords :
bending; diffusion; failure analysis; finite element analysis; fracture mechanics; fracture toughness; microassembling; moisture; plastic packaging; stress corrosion cracking; thermal stress cracking; 3D-FE analyses; bending experiments; critical fracture toughness; die attach layer; electronic packages; epoxy molding compounds; filler particles; fracture toughness; moisture diffusion properties; moisture preconditioning levels; polymers; popcorn failure; popcorn phenomenon; pre-cracked beams; surface crack; thermo-mechanical properties; Chip scale packaging; Delamination; Electromagnetic compatibility; Microassembly; Moisture; Particle beam measurements; Performance analysis; Plastic packaging; Polymers; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, 2001. First International IEEE Conference on
Conference_Location :
Potsdam, Germany
Print_ISBN :
0-7803-7220-4
Type :
conf
DOI :
10.1109/POLYTR.2001.973271
Filename :
973271
Link To Document :
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