Title :
Proposal to simplify development of a mixed signal test standard
Author_Institution :
Texas Instrum., USA
Abstract :
This paper proposes a method to simplify development of a mixed signal test standard by assigning the analog interconnect test to IEEE 1149.1 and the analog measurement test to IEEE P1149.4
Keywords :
IEEE standards; fault diagnosis; integrated circuit testing; measurement standards; mixed analogue-digital integrated circuits; IEEE 1149.1; IEEE P1149.4; analog interconnect test; analog measurement test; mixed signal test standard; Analog integrated circuits; Circuit testing; Instruments; Integrated circuit interconnections; Integrated circuit testing; Mirrors; Pins; Probes; Proposals; Standards development;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557037
