Title :
A general purpose ATE based IDDQ measurement circuit
Author :
Johnson, Gerald H. ; Wilstrup, Jan B.
Author_Institution :
Megatest Corp., Fridley, MN, USA
Abstract :
Previously published measurement circuits offered good solutions for measuring IDDQ on a fairly narrow range of part types. Most of these solutions have required adding circuitry either to the DUT board or to the DUT itself. In this paper we describe a general purpose, ATE Pin Electronics Card based, IDDQ measurement circuit. It gives good results over a very wide range of device types, supply currents, switching currents, bypass capacitance and IDDQ currents
Keywords :
CMOS integrated circuits; automatic test equipment; electric current measurement; integrated circuit measurement; integrated circuit noise; ATE; CMOS; DUT board; IDDQ measurement circuit; Pin Electronics Card; bypass capacitance; noise; supply currents; switching currents; Capacitance; Capacitors; Circuit testing; Current measurement; Diodes; Frequency; Phasor measurement units; Resistors; Time measurement; Voltage;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529822
