Title :
Early capture for boundary scan timing measurements
Author_Institution :
KLIC, Beaverton, OR, USA
Abstract :
Analog waveforms and delays can be measured using a simple extension of the IEEE 1149.X standards. Early capture samples data on a falling edge of TMS during the Update-DR state. Experiments suggest sub-nanosecond timing resolution
Keywords :
IEEE standards; analogue integrated circuits; automatic testing; boundary scan testing; delays; electronic equipment testing; integrated circuit testing; measurement standards; mixed analogue-digital integrated circuits; signal sampling; timing; IEEE 1149.X standards; Update-DR state; analog waveforms; boundary scan timing measurements; comparator; falling edge; high speed testing; mixed signal testing; propagation delays; samples data; subnanosecond timing resolution; Circuit testing; Clocks; Frequency synchronization; Logic testing; Oscilloscopes; Probes; Propagation delay; Semiconductor device measurement; System testing; Timing;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557045
