Title :
An estimation method for the n port S parameters with n-1 port measurements
Author :
Maeda, Noboru ; Fukui, Satoshi ; Ichikawa, Kazuhisa ; Sakurai, Yasushi ; Sekine, Taku ; Takahashi, Y.
Author_Institution :
NIPPON SOKEN, Inc., Nishio, Japan
Abstract :
An estimation method of the n-port S-parameters for reciprocal circuits is presented. In this method, several known loads are connected to one port in turn and reflection and transmission characteristics among the remaining ports are measured. Therefore, there is no need to connect a network analyzer to the port that is connected to the known loads. S-parameters are obtained by solving a linear least-squares equation and a quadratic equation only. In addition, applying this method to estimate the S-parameters of an immunity test system, validness of this method is confirmed.
Keywords :
S-parameters; estimation theory; immunity testing; least squares approximations; estimation method; immunity test system; linear least-squares equation; n port S parameters; n-1 port measurements; network analyzer; quadratic equation; reciprocal circuits; reflection characteristics; transmission characteristics; Equations; Frequency estimation; Mathematical model; Ports (Computers); Scattering parameters; Voltage measurement; BCI test; S-parameter; automotive components; immunity test; least-square method; multiple port circuit;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location :
Brugge
