• DocumentCode
    2047428
  • Title

    Absorbing Markov Chain solution for Possion´s equation

  • Author

    Gu, Keming ; Sadiku, Matthew N O

  • Author_Institution
    Horizon Airspace LLC, Norristown, PA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    297
  • Lastpage
    300
  • Abstract
    The Markov chain method for solving Laplace´s equation with Dirichlet boundary condition has been discussed in a few papers. This paper presents an absorbing Markov chain method to solve Possion´s equation with Dirichlet boundary condition. In the Markov chain, the fundamental matrix N defines the transient relationships for a randomly walking particle from state sj passing through state si before it reaches the absorbing state. From the fundamental matrix N and the probability matrix R from non-absorbing states to absorbing states, the contributions of boundary points and interior points to the potential of internal points are defined. The absorbing Markov chain method overcomes a major disadvantage of classic Monte Carlo methods that they are only capable of calculating the potential at a single point at a time unlike other numerical methods such as finite difference and finite element methods which provide simultaneously the solution at all the grid nodes. This paper presents an example to show the accuracy of the absorbing Markov chains solution
  • Keywords
    Markov processes; Poisson equation; matrix algebra; probability; Dirichlet boundary condition; Laplace equation solution; Monte Carlo methods; Possion equation; absorbing Markov Chain solution; absorbing states; accuracy; boundary points; fundamental matrix; interior points; nonabsorbing states; probability matrix; randomly walking particle; transient relationships; Biology computing; Boundary conditions; Chemistry; Electrical engineering; Finite difference methods; Finite element methods; Laplace equations; Legged locomotion; Markov processes; Monte Carlo methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon 2000. Proceedings of the IEEE
  • Conference_Location
    Nasville, TN
  • Print_ISBN
    0-7803-6312-4
  • Type

    conf

  • DOI
    10.1109/SECON.2000.845580
  • Filename
    845580