Title :
Ultra thin amorphous Si seedlayer for Co-Cr-Ta perpendicular magnetic recording layer
Author :
Kim, Y.J. ; Park, Y.H. ; Kong, S.H. ; Nakagawa, S. ; Kim, R.H.
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we propose an ultra thin amorphous Si layer as seedlayer for a Co-Cr-Ta recording layer and its properties are studied. It is characterized by AFM.
Keywords :
amorphous magnetic materials; atomic force microscopy; chromium alloys; cobalt alloys; coercive force; crystal structure; magnetic anisotropy; magnetic recording; magnetic structure; magnetic thin films; silicon; tantalum alloys; AFM; CoCrTa; CoCrTa perpendicular magnetic recording layer; Si; ultrathin amorphous Si seedlayer; Amorphous materials; Crystallography; Degradation; Epitaxial growth; Magnetic heads; Magnetic recording; Perpendicular magnetic recording; Soil; Sputtering; Stability;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230496
