Title :
Modeling indices of reliability for ramified embedded systems
Author_Institution :
Automated Control Syst. Dept., Lviv Polytech. Nat. Univ., Lviv
Abstract :
A method of investigation of reliability indices for ramified systems by means of generating functions is developed taking account of aging of the system´s output elements. Main reliability indices of ramified embedded systems are examined in this paper.
Keywords :
micromechanical devices; reliability; indices modeling; micromechanical devices; ramified embedded systems; reliability index; Actuators; Aging; Embedded system; Information processing; Magnetic sensors; Mechanical sensors; Microelectronics; Optical devices; Optical sensors; Sensor systems; Rayleigh distribution; embedded systems; generating functions; reliability indices;
Conference_Titel :
Perspective Technologies and Methods in MEMS Design, 2008. MEMSTECH 2008. International Conference on
Conference_Location :
Polyana
Print_ISBN :
978-966-2191-00-4
DOI :
10.1109/MEMSTECH.2008.4558742
