DocumentCode :
2047677
Title :
Virtual test of noise and jitter parameters
Author :
Helmreich, K. ; Reinwardt, G.
Author_Institution :
Advantest (Europe) GmbH, Munchen, Germany
fYear :
1996
fDate :
20-25 Oct 1996
Firstpage :
461
Lastpage :
470
Abstract :
Virtual test has proven its enormous advantages for test development, yet the use of deterministic simulation models prevented reproduction of statistical effects. This paper introduces a virtual test concept that includes noise and jitter phenomena
Keywords :
automatic testing; deterministic algorithms; digital simulation; jitter; random noise; concurrent engineering; deterministic simulation models; jitter parameters; noise; simulation environment; statistical effects; test development; virtual test; Analytical models; Computational modeling; Computer simulation; Debugging; Jitter; Logic testing; Prototypes; Silicon; System testing; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-3541-4
Type :
conf
DOI :
10.1109/TEST.1996.557058
Filename :
557058
Link To Document :
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