Title :
Digital integrated circuit testing using transient signal analysis
Author :
Plusquellic, James E. ; Chiarulli, Donald M. ; Levitan, Steven P.
Author_Institution :
Dept. of Comput. Sci., Pittsburgh Univ., PA, USA
Abstract :
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test points. We present simulation and hardware experiments which show distinguishable characteristics between the transient waveforms of defective and non-defective devices. These variations are shown to exist for CMOS open drain and bridging defects, located both on and off of a sensitized path
Keywords :
CMOS digital integrated circuits; automatic testing; integrated circuit measurement; integrated circuit testing; transient analysis; CMOS; IDD switching transients; bridging defects; defective devices; digital integrated circuits; open drain defects; sensitized path; supply rails; test points; transient signal analysis; transient waveforms; voltage transients; CMOS digital integrated circuits; Circuit testing; Digital circuits; Digital integrated circuits; Integrated circuit testing; Rails; Signal analysis; Switching circuits; Transient analysis; Voltage;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557062
