DocumentCode
2047899
Title
The titanic: what went wrong! [integrated circuit design]
Author
Nassif, Sani R.
Author_Institution
IBM Res., Austin, TX, USA
fYear
2005
fDate
13-17 June 2005
Firstpage
349
Lastpage
350
Abstract
We often hear about success stories in EDA. We are all justifiably proud of the impact we collectively make on the overall integrated circuit design and manufacturing machine. It is fair to say, however, the one learns far more from failure than one does from success. In this special session we found several brave practitioners who are willing to talk about problems in business-as-usual EDA. These problems include technology related issues; reliability related issues, power issues and even methodology issues - in short, covering a wide swatch of the EDA domain.
Keywords
electronic design automation; integrated circuit design; integrated circuit reliability; IC manufacturing; electronic design automation; integrated circuit design; integrated circuit reliability; Aging; Application specific integrated circuits; Electronic design automation and methodology; Integrated circuit manufacture; Integrated circuit reliability; Integrated circuit synthesis; Integrated circuit technology; MOS devices; Manufacturing processes; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN
1-59593-058-2
Type
conf
DOI
10.1109/DAC.2005.193831
Filename
1510351
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