• DocumentCode
    2047899
  • Title

    The titanic: what went wrong! [integrated circuit design]

  • Author

    Nassif, Sani R.

  • Author_Institution
    IBM Res., Austin, TX, USA
  • fYear
    2005
  • fDate
    13-17 June 2005
  • Firstpage
    349
  • Lastpage
    350
  • Abstract
    We often hear about success stories in EDA. We are all justifiably proud of the impact we collectively make on the overall integrated circuit design and manufacturing machine. It is fair to say, however, the one learns far more from failure than one does from success. In this special session we found several brave practitioners who are willing to talk about problems in business-as-usual EDA. These problems include technology related issues; reliability related issues, power issues and even methodology issues - in short, covering a wide swatch of the EDA domain.
  • Keywords
    electronic design automation; integrated circuit design; integrated circuit reliability; IC manufacturing; electronic design automation; integrated circuit design; integrated circuit reliability; Aging; Application specific integrated circuits; Electronic design automation and methodology; Integrated circuit manufacture; Integrated circuit reliability; Integrated circuit synthesis; Integrated circuit technology; MOS devices; Manufacturing processes; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2005. Proceedings. 42nd
  • Print_ISBN
    1-59593-058-2
  • Type

    conf

  • DOI
    10.1109/DAC.2005.193831
  • Filename
    1510351