• DocumentCode
    2047999
  • Title

    Correlating defects to functional and IDDQ tests

  • Author

    Powell, Theo J. ; Pair, James R. ; Carbajal, Bernard G., III

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    501
  • Lastpage
    510
  • Abstract
    Functional tests and IDDQ tests are studied to determine their effectiveness toward screening failures. A model is presented for curve fitting correlation data between fault coverages and defect quality employing the Williams and Brown defect level to fault coverage equation. The model is used for multiple test types. Empirical data were gathered to demonstrate its effectiveness over functional and IDDQ tests. IDDQ test data demonstrates two categories of IDDQ defects: pattern sensitive and pattern insensitive defects
  • Keywords
    CMOS digital integrated circuits; curve fitting; failure analysis; integrated circuit testing; quality control; CMOS digital ICs; IDDQ tests; QC; curve fitting correlation data; defect correlation; defect quality; failure screening; functional tests; multiple test types; pattern insensitive defects; pattern sensitive defects; Application specific integrated circuits; CMOS technology; Curve fitting; Equations; Fault detection; MOS devices; MOSFETs; Manufacturing; Semiconductor device modeling; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.557075
  • Filename
    557075
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2047999