Title :
A comparison of test requirements, methods, and results for seven MCM products
Author_Institution :
Semicond. Products Sector, Motorola Inc., Tempe, AZ, USA
Abstract :
This paper presents seven MCM designs, compares and contrasts the test approaches used in each design, and lists test solutions and recommendations that can be extended to future MCM technology. Important topics covered include design-for-testability, logic simulation, and fault diagnosis. Unique to this discussion are details concerning the refinement of test practices required to support product transition from prototype design to volume manufacturing
Keywords :
VLSI; application specific integrated circuits; automatic test software; built-in self test; circuit analysis computing; computer testing; design for manufacture; design for testability; digital signal processing chips; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; microcontrollers; multichip modules; production testing; ASIC; ATPG; BIST; DRAM; MCM products; VLSI tester; behavioral model; design-for-testability; fault diagnosis; flash memory; gate level model; hardware models; logic simulation; memory IC; microcontroller; processing elements; product transition; prototype design; simulation environment; test methods; test requirements; volume manufacturing; Application specific integrated circuits; Assembly; Automatic testing; Control systems; Fault diagnosis; Flash memory; Microcontrollers; Prototypes; Random access memory; Refining;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529834
