• DocumentCode
    2048322
  • Title

    Concatenated Reed-Solomon Code with Hamming Code for DRAM Controller

  • Author

    Rhee, Sunwook ; Kim, Changgeun ; Kim, Juhee ; Jee, Yong

  • Author_Institution
    Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
  • Volume
    1
  • fYear
    2010
  • fDate
    19-21 March 2010
  • Firstpage
    291
  • Lastpage
    295
  • Abstract
    In this paper, we propose a concatenated Reed-Solomon code with a Hamming code for dynamic random access memory (DRAM) controller. The concatenated code consists of a Reed-Solomon outer code, two shortened Reed-Solomon codes, and a Hamming inner code. The proposed code takes the advantages of Reed-Solomon codes and Hamming codes to protect DRAM memory data against single event upsets and multiple bit upsets. At the byte error rate of 10-7, the proposed decoder shows about 1.3 dB of coding gain over that of the conventional Reed-Solomon decoder. We implement the proposed concatenated Reed-Solomon code on a very large-scale integration (VLSI) chip with 0.13 ¿ m complementary metal oxide semiconductor (CMOS) standard cell library at a supply voltage of 1.2 V. The core area of proposed architecture is 1.12 mm2 with the gate counts of 121,900. The synthesized result shows the maximum throughput of 1.71 Gbps and the measured power consumption of 69 mW at 259 MHz.
  • Keywords
    DRAM chips; Hamming codes; Reed-Solomon codes; VLSI; cellular arrays; concatenated codes; controllers; CMOS; DRAM controller; DRAM memory data; Hamming codes; Reed-Solomon decoder; VLSI chip; byte error rate; complementary metal oxide semiconductor standard cell library; concatenated Reed-Solomon codes; dynamic random access memory controller; very large scale integration; Concatenated codes; DRAM chips; Decoding; Error analysis; Gain; Large scale integration; Protection; Random access memory; Reed-Solomon codes; Single event upset; Concatenated codes; Error correcting codes(ECC); Hamming code; Reed-Solomon code; memory controller;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Engineering and Applications (ICCEA), 2010 Second International Conference on
  • Conference_Location
    Bali Island
  • Print_ISBN
    978-1-4244-6079-3
  • Electronic_ISBN
    978-1-4244-6080-9
  • Type

    conf

  • DOI
    10.1109/ICCEA.2010.65
  • Filename
    5445819