DocumentCode
2048863
Title
Black Box Polynomial Identity Testing of Generalized Depth-3 Arithmetic Circuits with Bounded Top Fan-In
Author
Karnin, Zohar S. ; Shpilka, Amir
Author_Institution
Fac. of Comput. Sci., Technion - Israel Inst. of Technol., Haifa
fYear
2008
fDate
23-26 June 2008
Firstpage
280
Lastpage
291
Abstract
In this paper we consider the problem of determining whether an unknown arithmetic circuit, for which we have oracle access, computes the identically zero polynomial. This problem is known as the black-box polynomial identity testing (PIT) problem. Our focus is on polynomials that can be written in the form f(xmacr) = Sigmai=1 k hi(xmacr) ldr gi(xmacr), where each hi is a polynomial that depends on at most p linear functions, and each gi is a product of linear functions (when hi = 1, for each i, then we get the class of depth-3 circuits with k multiplication gates, also known as SigmaPiSigma(k) circuits, but the general case is much richer). When maxi(deg(hildrgi)) = d we say that f is computable by a SigmaPiSigma(k, d, p) circuit. We obtain the following results. 1. A deterministic black-box identity testing algorithm for SigmaPiSigma(k, d, p) circuits that runs in quasi-polynomial time (for p = polylog(n + d)). 2. A deterministic black-box identity testing algorithm for read-k SigmaPiSigma circuits (depth-3 circuits where each variable appears at most k times) that runs in time n2 o(k2) This gives a polynomial time algorithm for k = 0(1). These are the first sub-exponential black-box PIT algorithms for circuits of depth higher than 2. Our results can also be stated in terms of test sets for the underlying circuit model. A test set is a set of points s.t. if two circuits get the same values on every point of the set then they compute the same polynomial. Thus, our first result gives an explicit test set, of quasi-polynomial size, for SigmaPiSigma(k, d, p) circuits (for p = polylog(n + d)). Our second result gives an explicit polynomial size test set for read-k depth-3 circuits. The proof technique involves a construction of a family of affine subspaces that have a rank-preserving property that is inspired by the construction of linear seeded extr- - actors for affine sources of Gabizon andRaz [9], and a generalization of a theorem of [8] regarding the structure of identically zero depth-3 circuits with bounded top fan-in.
Keywords
circuit testing; polynomials; black box polynomial identity testing; bounded top fan-in; generalized depth-3 arithmetic circuits; identically zero polynomial; linear functions; oracle access; quasi-polynomial time; sub-exponential black-box PIT algorithms; Circuit testing; Computational complexity; Computer science; Digital arithmetic; Polynomials; PIT; arithmetic circuit; depth-3; deterministic; polynomial identity testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Complexity, 2008. CCC '08. 23rd Annual IEEE Conference on
Conference_Location
College Park, MD
ISSN
1093-0159
Print_ISBN
978-0-7695-3169-4
Type
conf
DOI
10.1109/CCC.2008.15
Filename
4558830
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