Title :
Relaxation processes in the lower layer of antiferromagnetically coupled media
Author :
Moser, Andreas ; Berger, Andreas ; Margulies, David T. ; Fullerton, Eric E.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper we study the antiferromagnetically coupled recording media with different LL thicknesses, AF coupling, and LL intergranular exchange were investigated. The spinstand measurements are complemented by magnetometry measurements.
Keywords :
antiferromagnetic materials; exchange interactions (electron); magnetic heads; magnetic recording; magnetic relaxation; magnetic thin films; AF coupling; antiferromagnetically coupled recording media; lower layer intergranular exchange; magnetometry measurements; relaxation processes; spinstand measurements; Antiferromagnetic materials; Automatic frequency control; Coercive force; Energy states; Monitoring; Signal processing; Thermal stability; Writing;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230580
