Title :
Standard test interface language (STIL) a new language for patterns and waveforms
Author :
Taylor, Tony ; Maston, Gregory A.
Author_Institution :
Credence Syst. Corp., Fremont, CA, USA
Abstract :
This paper presents the major features and capabilities of the new standard test interface language (STIL). A synopsis of the language, typical applications of the language, work that has been done to date, and degree of acceptance by the industry are discussed
Keywords :
automatic test software; computational complexity; digital integrated circuits; high level languages; integrated circuit testing; measurement standards; timing; waveform analysis; STIL; acceptance; data volume minimisation; digital integrated circuits; industry; patterns; standard test interface language; waveforms; Circuit simulation; Circuit testing; Design optimization; Digital integrated circuits; Discrete event simulation; Electronic mail; Hardware; Integrated circuit testing; Meetings; Standards development;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557091
