Title :
LIMSoft: automated tool for design and test integration of analog circuits
Author :
Hamida, Naim Ben ; Saab, Khaled ; Marche, David ; Kaminska, Bozena ; Quesnel, Guy
Author_Institution :
OPMAX Inc., Montreal, Que., Canada
Abstract :
Integrating design and test presents a good challenge in today´s analog circuit manufacturing process. Designs should be made according to the sensitivity of the output to all the components. Furthermore, sensitivity can be used to observe component deviation (soft faults) and hard faults from the output. This paper presents an automated sensitivity analysis tool, called LIMSoft, which offers the possibility of sensitivity computation and analysis in order to design fault-resistant circuits and generate test vectors for both soft and hard faults. Some applications for integrating test and design are also presented
Keywords :
SPICE; analogue circuits; automatic test software; circuit CAD; circuit analysis computing; design for manufacture; design for testability; fault diagnosis; integrated circuit testing; integrated circuit yield; sensitivity analysis; LIMSoft; Monte Carlo simulation; SPICE; analog circuits; automated sensitivity analysis tool; automated tool; component deviation; design test integration; fault dictionary generator; fault simulation; fault-resistant circuits; hard faults; manufacturing process; mismatch analysis; sensitivity computation; soft faults; test vectors; yield estimation; Analog circuits; Analog integrated circuits; Automatic testing; Circuit analysis computing; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Manufacturing processes; Process design;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557094