• DocumentCode
    2049590
  • Title

    A Novel Technique to Model the Variation of the Intrinsic Parameters of an Automatic Zoom Camera using Adaptive Delaunay Meshes Over Moving Least-Squares Surfaces

  • Author

    Sarkis, Michel ; Senft, Christian T. ; Diepold, Klaus

  • Author_Institution
    Tech. Univ. Munchen, Munich
  • Volume
    5
  • fYear
    2007
  • fDate
    Sept. 16 2007-Oct. 19 2007
  • Abstract
    The accuracy of computer vision systems is highly dependent on the correct estimates of the camera intrinsic parameters. This accuracy is important in numerous applications like telepresence and robot navigation. In this work, a novel technique is proposed to model the variation of the camera´s intrinsic parameters as a function of the focus and the zoom. The proposed method computes the complete surfaces of the intrinsic parameters from a predefined number of focus/zoom measurements using a moving least-squares (MLS) regression technique. Then, it approximates the generated MLS surfaces by employing adaptive Delaunay meshes. Compared to a previous technique using bivariate polynomial functions, the new method results in a 94% enhancement of the mean estimation error. In addition, the new method leads to the same accuracy of the results as compared to a previous version of the MLS technique while requiring a less amount of computations.
  • Keywords
    cameras; computer vision; image enhancement; least squares approximations; mesh generation; regression analysis; surface fitting; adaptive Delaunay mesh; automatic zoom camera; bivariate polynomial function; computer vision system; image enhancement; intrinsic parameter; mean estimation error; moving least-squares surface; regression technique; Apertures; Application software; Cameras; Computer vision; Focusing; Lenses; Multilevel systems; Navigation; Polynomials; Robot vision systems; Machine vision; lenses; modeling; optical distortion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2007. ICIP 2007. IEEE International Conference on
  • Conference_Location
    San Antonio, TX
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1437-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2007.4379856
  • Filename
    4379856