• DocumentCode
    2049937
  • Title

    High resolution MFM: simulation of tip sharpening

  • Author

    Saito, H. ; van den Bos, A.G. ; Abelmann, L. ; Lodder, J.C.

  • Author_Institution
    MESA Res. Inst., Twente Univ., Enschede, Netherlands
  • fYear
    2003
  • fDate
    March 30 2003-April 3 2003
  • Lastpage
    18
  • Abstract
    In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution.
  • Keywords
    magnetic force microscopy; sensitivity; transfer functions; high resolution MFM; tip sharpening effect; tip-end shapes; Artificial intelligence; Frequency; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic recording; Perpendicular magnetic recording; Shape; Signal resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2003. INTERMAG 2003. IEEE International
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7647-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2003.1230602
  • Filename
    1230602
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2049937