Title :
High resolution MFM: simulation of tip sharpening
Author :
Saito, H. ; van den Bos, A.G. ; Abelmann, L. ; Lodder, J.C.
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution.
Keywords :
magnetic force microscopy; sensitivity; transfer functions; high resolution MFM; tip sharpening effect; tip-end shapes; Artificial intelligence; Frequency; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic recording; Perpendicular magnetic recording; Shape; Signal resolution;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230602
