• DocumentCode
    2050130
  • Title

    A generic micro-architectural test plan approach for microprocessor verification

  • Author

    Adir, Allon ; Azatchi, Hezi ; Bin, Eyal ; Peled, Ofer ; Shoikhet, Kirill

  • Author_Institution
    IBM Res. Lab., Haifa Univ., Israel
  • fYear
    2005
  • fDate
    13-17 June 2005
  • Firstpage
    769
  • Lastpage
    774
  • Abstract
    Modern microprocessors share several common types of micro-architectural building blocks. The rising complexity of the micro-architecture increases the risk of bugs and the difficulty of achieving comprehensive verification. We propose a methodology to exploit the commonality in the different microprocessors to create a design-independent micro-architectural test plan. Our method allows the testing of the huge micro-architectural test space by using systematic partitioning, which offers a high level of comprehensiveness of the tested behaviors. We show how this method was used to find bugs during verification of an actual high-end microprocessor. Our results show the advantages of this approach over the more traditional test methods that use design specific test plans or that use tools with little micro-architectural knowledge for covering micro-architectural aspects of the design.
  • Keywords
    automatic test pattern generation; circuit complexity; formal verification; integrated circuit testing; logic partitioning; logic testing; microprocessor chips; parallel architectures; automatic test pattern generation; circuit complexity; design-independent micro-architectural test; formal verification; generic micro-architectural test plan; high-end microprocessor; integrated circuit testing; logic partitioning; logic testing; micro-architectural building blocks; micro-architectural test space; micro-architecture complexity; microprocessor chips; microprocessor verification; parallel architectures; systematic partitioning; Computer bugs; Design methodology; Laboratories; Logic design; Logic testing; Microprocessors; Modems; Permission; Pipelines; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2005. Proceedings. 42nd
  • Print_ISBN
    1-59593-058-2
  • Type

    conf

  • DOI
    10.1109/DAC.2005.193919
  • Filename
    1510439