Title :
VLIW - a case study of parallelism verification
Author :
Adir, Allon ; Arbetman, Yaron ; Dubrov, Bella ; Liechtenstein, Y. ; Rimon, Michal ; Vinov, Michael ; Calligaro, Massimo A. ; Cofler, Andrew ; Duffy, Gabriel
Author_Institution :
IBM Res. Lab., Haifa, Israel
Abstract :
Parallelism in processor architecture and design imposes a verification challenge as the exponential growth in the number of execution combinations becomes unwieldy. In this paper we report on the verification of a very large instruction word processor. The verification team used a sophisticated test program generator that modeled the parallel aspects as sequential constraints, and augmented the tool with manually written test templates. The system created large numbers of legal stimuli, however the quality of the tests was proved insufficient by several post silicon bugs. We analyze this experience and suggest an alternative, parallel generation technique. We show through experiments the feasibility of the new technique and its superior quality along several dimensions. We claim that the results apply to other parallel architectures and verification environments.
Keywords :
automatic test pattern generation; formal verification; integrated circuit testing; logic testing; microprocessor chips; parallel architectures; VLIW; automatic test pattern generation; formal verification; integrated circuit testing; logic testing; microprocessor chips; parallel architectures; parallel generation technique; parallelism verification; processor architecture; sequential constraints; test program generator; very large instruction word processor; Automatic programming; Computer bugs; Law; Legal factors; Parallel architectures; Process design; Sequential analysis; Silicon; System testing; VLIW;
Conference_Titel :
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN :
1-59593-058-2
DOI :
10.1109/DAC.2005.193921