Title :
A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs
Author :
Topaloglu, Rasit Onur ; Orailoglu, A.
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., La Jolla, CA, USA
Abstract :
A design for test (DFT) hardware is proposed to increase the controllability of a thermometer coded current steering digital to analog converter. A procedure is introduced to reduce the diagnosis and structural test time from quadratic to linear using the proposed DFT hardware. To evaluate the applicability of the proposed technique, principal component analysis is used to create virtual process variations to simulate in lieu of semiconductor fabrication data. An architecture specific soft fault model is suggested for the diagnosis problem. Random errors according to the fault model are introduced in the virtual test environment on top of the process variations and it is shown that diagnosis of a fault is possible with high accuracy with the proposed method. The same technique employing principal component analysis is furthermore used to provide process variation-aware reference test comparison values for a structural test of the DAC. The structural test provides a mechanism to test for even unmodeled manufacturing faults. The process variation-aware test values help detect defects even under process variations. The proposed DFT hardware and method are low cost and quite suitable for a built-in self diagnosis and test implementation.
Keywords :
automatic test pattern generation; built-in self test; design for testability; digital-analogue conversion; fault simulation; integrated circuit testing; principal component analysis; built-in self diagnosis; design for test hardware; design for testability; digital to analog converter; fault diagnosis; principal component analysis; process variation-aware structural test; process variation-aware test values; semiconductor fabrication data; soft fault model; structural test time; test implementation; thermometer coded current steering DAC; virtual process variations; virtual test environment; Analytical models; Controllability; Design for testability; Digital-analog conversion; Fabrication; Fault diagnosis; Hardware; Manufacturing; Principal component analysis; Testing;
Conference_Titel :
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN :
1-59593-058-2
DOI :
10.1109/DAC.2005.193934