Structural characterization and magnetization reversal of 0.1 /spl mu/m scale antidot-type arrays patterned by Ga/sup +/ irradiation

Author

Owen, N.W. ; Petford-Long, A.K.

Author_Institution

Dept. of Mater., Oxford Univ., UK

fYear

2003

fDate

March 30 2003-April 3 2003

Abstract

In this article, we present conventional transmission electron microscopy (TEM), Lorentz TEM and micromagnetic simulation, the relation between the structural changes accompanying the irradiation process and the magnetisation reversal of magnetic films patterned with arrays of 0.1/spl mu/m scale square antidots. The arrays have been fabricated in Co thin film as well as NiFe thin film using a focused ion beam system.

Keywords

cobalt; ferromagnetic materials; ion beam effects; iron alloys; magnetic domains; magnetic thin films; magnetisation reversal; micromagnetics; nickel alloys; quantum dots; transmission electron microscopy; 0.1 micron; Co; Co thin film; Ga/sup +/ irradiation; Lorentz TEM; NiFe; NiFe thin film; antidot type arrays; conventional transmission electron microscopy; domain structure; focused ion beam system; irradiation process; magnetic films; magnetization reversal; micromagnetic simulation; Atomic layer deposition; Electron microscopy; Gas insulated transmission lines; Magnetic films; Magnetic force microscopy; Magnetic materials; Magnetic properties; Magnetization reversal; Sputtering; Transmission electron microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2003. INTERMAG 2003. IEEE International

Conference_Location

Boston, MA, USA

Print_ISBN

0-7803-7647-1

Type

conf

DOI

10.1109/INTMAG.2003.1230643

Filename

1230643