Title :
Topographic and magnetic structure of undulated permalloy films measured in UHV
Author :
Pandana, H. ; Dreyer, M. ; Gomez, R.D.
Author_Institution :
Maryland Univ., College Park, MD, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this article, we characterized the films by magnetic force microscopy (MFM), contact potential microscopy (CPM) as well as STM within the same UHV system.
Keywords :
Permalloy; contact potential; ferromagnetic materials; magnetic domains; magnetic force microscopy; magnetic structure; magnetic thin films; scanning tunnelling microscopy; CPM; MFM; NiFe; STM; UHV system; contact potential microscopy; magnetic force microscopy; magnetic structure; undulated permalloy films; Coercive force; Electrons; Magnetic films; Magnetic force microscopy; Magnetic materials; Polarization; Semiconductor films; Silicon; Spin polarized transport; Surface cleaning;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230645
