• DocumentCode
    2051051
  • Title

    Grain filtering in MILC and its impact on performance of n- and p-channel TFTs

  • Author

    Nagata, Sho ; Nakagawa, Gou ; Asano, Tanemasa

  • Author_Institution
    Dept. of Electron., Kyushu Univ., Fukuoka, Japan
  • fYear
    2010
  • fDate
    21-24 Nov. 2010
  • Firstpage
    951
  • Lastpage
    956
  • Abstract
    Metal induced lateral crystallization (MILC) using nickel di-silicide catalyst is able to grow poly-Si films having a preferential crystal orientation along surface normal direction. The poly-Si film prepared by MILC, however, contains randomly distributed sub-grain boundaries which may degrade the performance of poly-Si TFT fabricated using the MILC film. We have investigated effects of patterning of the a-Si film prior to MILC on the growth characteristics and TFT performance. When the width of a-Si film pattern was narrowed, grain filtering effect occurred and, as a result, poly-Si islands whose active region for TFT is mostly composed of single oriented crystal were successfully grown. We characterized the film thus prepared by fabricating n and p-channel TFTs. TFTs were fabricated using the standard high temperature process. The results indicated that TFT performance is very much improved in terms of carrier mobility, on-current, and sub-threshold swing. We conclude that the pre-growth pattering of a-Si in MILC is useful technique to improve the performance of MILC TFTs.
  • Keywords
    carrier mobility; crystal orientation; crystallisation; elemental semiconductors; nickel compounds; semiconductor thin films; silicon; thin film transistors; NiSi2; Si; a-Si film pattern; carrier mobility; crystal orientation; grain filtering; metal induced lateral crystallization; n-channel TFT; nickel di-silicide catalyst; p-channel TFT; poly-Si films; sub-grain boundaries; Metal induced lateral crystallization (MILC); thin film transistor (TFT);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2010 - 2010 IEEE Region 10 Conference
  • Conference_Location
    Fukuoka
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-6889-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2010.5686540
  • Filename
    5686540