DocumentCode :
2051136
Title :
Reliability considerations for implantable medical ICs
Author :
Porter, Mark ; Gerrish, Paul ; Tyler, Larry ; Murray, Sharon ; Mauriello, Rob ; Soto, Frank ; Phetteplace, Gaylene ; Hareland, Scott
Author_Institution :
Medtronic Microelectron. Center, Tempe, AZ
fYear :
2008
fDate :
April 27 2008-May 1 2008
Firstpage :
516
Lastpage :
523
Abstract :
Implantable medical devices continue to grow in complexity, mirroring the ascent of the semiconductor industry along the Moorepsilas Law curve. Traditionally, implantable applications have taken a fast-follower approach to silicon adoption, using more mature technologies to reduce risk. While commercial manufacturers, in some circumstances, may be able to trade off lifetime requirements for performance, this is decidedly not the case for implantable use, where 10 to 12 year requirements are typical. On the other hand, hardware and software redundancy solutions employed by high reliability avionics, telecommunications, and servers are difficult to implement in a battery-powered device, where current drain restrictions are severe. This paper discusses some of the reliability challenges faced by implantable device manufacturers as the need to provide more sophisticated therapy and diagnostics requires increasingly advanced technologies.
Keywords :
biomedical electronics; integrated circuit reliability; prosthetics; Implantable medical devices; integrated circuits; medical electronics; reliability; Aerospace electronics; Electronics industry; Hardware; Implantable biomedical devices; Medical diagnostic imaging; Moore´s Law; Pulp manufacturing; Redundancy; Semiconductor device manufacture; Silicon; high-reliability electronics; implantable devices; medical electronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-2049-0
Electronic_ISBN :
978-1-4244-2050-6
Type :
conf
DOI :
10.1109/RELPHY.2008.4558939
Filename :
4558939
Link To Document :
بازگشت