DocumentCode :
2051175
Title :
Comparison of the scintillation properties of LSO:Ce manufactured by different laboratories and of LGSO:Ce
Author :
Kapusta, M. ; Moszynski, M. ; Balcerzyk, M. ; Braziewicz, J. ; Wolski, D. ; Pawelke, J. ; Klamra, W.
Author_Institution :
Soltan Inst. for Nucl. Studies, Swierk, Poland
Volume :
2
fYear :
1999
fDate :
1999
Firstpage :
704
Abstract :
We measured photoelectron yield, light output, decay times of the light pulses, cerium concentration, energy resolution and time resolution of LSO:Ce manufactured by different laboratories and LGSO:Ce. The LSO samples show excellent scintillation properties: high light output, close to 30,000 ph/MeV and good energy resolution of 7.3% FWHM for 137Cs γ-source full energy peak. Time resolution measured in geometry fulfilling the PET scanners requirements is equal to 450 ps. We also present results from the measurements with LGSO:Ce by Hitachi Chemical Co., which is of similar chemical composition to LSO. LGSO, at present stage of development, shows about 20% lower light output than LSO and energy resolution of 12.4% FWHM for 662 keV γ-rays. LSO crystals used in our studies posses similar in scintillation properties, although we suppose that the details of the productions method are different due to the differences in Ce concentration. LGSO is a new and very promising scintillator due to lower background radiation in comparison to LSO, but it features worse energy resolution and smaller number of photoelectrons
Keywords :
cerium; gamma-ray detection; lutetium compounds; solid scintillation detectors; LGSO:Ce; LSO:Ce; Lu2SiO5:Ce; PET scanners requirements; cerium concentration; decay times; energy resolution; light output; photoelectron yield; scintillation properties; time resolution; Cerium; Chemicals; Energy measurement; Energy resolution; Geometry; Laboratories; Manufacturing; Positron emission tomography; Pulse measurements; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Conference_Location :
Seattle, WA
ISSN :
1082-3654
Print_ISBN :
0-7803-5696-9
Type :
conf
DOI :
10.1109/NSSMIC.1999.845765
Filename :
845765
Link To Document :
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